Thin carbon films have been prepared by ArF excimer laser ablation of hard fullerene-based carbon in vacuum. The target material was obtained from a pressure - temperature treatment of fullerene. Micro-Raman, electron energy loss and electron diffraction measurements of deposited films reveal distinct evidence of microcrystalline diamond. Appearance of the diamond fraction in the films can be related to a peculiar structure of the target substance.
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Kozlov et al. (1996) studied this question.
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