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Fundamentals of dielectric capacitor technology and multifactor stress aging of all classes of insulating media that form elements of this technology are addressed. The goal is the delineation of failure processes in highly stressed compact capacitors. Factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges are discussed. Diagnostic measurement techniques available and those being developed to determine material degradation affecting available life and failure probability of capacitors are presented.>
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Laghari et al. (1992) studied this question.
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