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Magnetic tunnel junctions integrated for spin-transfer torque magnetoresistive random-access memory are by far the only known solid-state memory element that can realize a combination of fast read/write speed and high endurance. This paper presents a comprehensive validation of high endurance of deeply scaled perpendicular magnetic tunnel junctions (pMTJs) in light of various potential spin-transfer torque magnetoresistive random-access memory (STT-MRAM) use cases. A statistical study is conducted on the time-dependent dielectric breakdown (TDDB) properties and the dependence of the pMTJlifetime on voltage, polarity, pulsewidth, duty cycle, and temperature. The experimental results coupled with TDDB models project >1015write cycles. Furthermore, this work reports system-level workload characterizations to understand the practical endurance requirements for realistic memory applications.The results suggestthat the cycling endurance of STT-MRAM is “practically unlimited,” which exceeds the requirements of various memory use cases, including high-performance applications such as CPU level-2 and level-3 caches.
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Kan et al. (2017) studied this question.
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