The mobility of partial dislocations in thin foils of ZnS is studied by “in situ” tensile tests in a transmission electron microscope at 390 K. Numerous sources are observed emitting partial dislocations that propagate in an either correlated or uncorrelated manner. The velocity of partial dislocations is found to depend on their length; a strong enhancement of dislocation movement under electronic excitation is noticed. These results are analyzed in the general frame of the Peierls mechanism, with a second-order lattice friction on kinks.
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Faress et al. (1993) studied this question.
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