Magnetoresistance in epitaxially grown degenerate ZnO thin films

The magnetoresistance of high-quality epitaxial doped ZnO(:Ga) thin films with various electron concentrations ranging from 3.2×1018 to 1.3×1020cm−3 has been measured. All samples investigated exhibit a negative magnetoresistance at low magnetic fields. Its magnitude systematically depends on carrier concentration and temperature. Low-doped samples switch the sign of the magnetoresistance and the conventional positive component dominates at high fields, whereas highly doped degenerate samples only show a negative component up to fields of 14.5 T. Therefore, the data are analyzed as the sum of a positive and negative contribution to the magnetoresistance applying a semiempirical expression to describe the observed behavior. The model takes into account third-order s–d exchange Hamiltonians describing the negative part and a two-band model for the positive contribution. Least-squares fits to the data are presented. Theory and experiment are in excellent agreement.