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Traps in Fe-doped semi-insulating InP samples have been studied by thermally stimulated current spectroscopy with IR (hν≤1.12 eV) excitation at 81 K. The possible involvement of native defects in determining the compensation mechanisms is suggested based on the observation of other than the usual 0.64 eV Fe-related activation energy for the dark current in one of the four samples supplied from different sources. A metastable behavior of traps in another sample was found and explained by a charge-controlled defect reaction model. Three out of the six traps observed are suggested to be electron traps and one among the other three traps is believed to be a hole trap.
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Fang et al. (1992) studied this question.
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