We report a high-resolution synchrotron grazing incidence x-ray diffraction measurement of a surface crystalline monolayer at the liquid-vapor interface of the n-alkane eicosane (C₂₀H₄₂) just above its melting temperature. The peak width of the surface monolayer rotator phase is shown to be resolution limited and implies positional correlations of at least {~}1 {μ}m. The high resolution allowed determination of the temperature dependence of the peak position over the narrow (3 ^∘{}C) temperature range of the surface crystal phase. The two-dimensional thermal expansion was determined to be (dA/dT)/A=1.8(±0.1)×10^-3^∘C^-1, which is comparable to the expansion in similar chain length bulk n-alkane rotator phases. Our data are consistent with the power-law shaped scattering tails expected from quasi-long-range order in two dimensions.
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Ocko et al. (2001) studied this question.
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