Cavity-Enhanced Measurements of Defect Spins in Silicon Carbide

Engineering the photonic interface with spins in color centers, such as the N00exV center in diamond or the neutral divacancy in silicon carbide, is crucial for applications in quantum communication and precision sensing. Exploiting SiC's compatibility with conventional thin-film fabrication, the authors use on-chip nanoscale photonic crystal cavities to dramatically enhance the measurement of the spin and optical properties of color-center ensembles. These results bring us a step closer to realizing scaled-up defect-based quantum technologies.