The performance of CsI photocathodes has been characterized for use with grazing incidence soft x rays. The total electron yield and pulsed quantum efficiency of a CsI photocathode has been measured in a reflection geometry as a function of photon energy (100 eV to 1 keV), angle of incidence, and the electric field between the anode and photocathode. The total electron yield and pulsed quantum efficiency increase as the x-ray penetration depth approaches the secondary electron escape depth. Unit quantum efficiency in a grazing incidence geometry is demonstrated. A weak electric-field dependence is observed for the total yield measurements; while no significant dependence is found for the pulsed quantum efficiency. The effect of the pulse height distribution on the detective quantum efficiency is discussed. Theoretical predictions agree accurately with experiment.
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Lowney et al. (2004) studied this question.