We present a new method of utilizing a filter–fluorescer system for measuring high fluence x-rays above 120 keV, where there are no practical absorption edges available for conventional filter–fluorescer techniques. The absorption edge (Ep keV) of the prefilter is chosen to be less than that of the fluorescer (Ef keV), i.e., Ep
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C. L. Wang (1981) studied this question.