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Ferroelectric epitaxial superlattices combining PbZr0.4Ti0.6O3 and PbZr0.6Ti0.4O3 ultrathin films were grown by pulsed laser deposition onto vicinal SrTiO3 (001) substrates. The superlattices were subjected to structural characterization by means of (high-resolution) transmission electron microscopy and x-ray diffraction, to piezoelectric-force microscopy, and to macroscopic ferroelectric measurements. The thickness of the individual PbZrxTi1−xO3 layers was found to play an important role in the overall structure adopted by the superlattices. Superlattices consisting of 22 bilayers of 5nm thin PbZr0.4Ti0.6O3 layers and 3nm thin PbZr0.6Ti0.4O3 layers involve continuous 90° a–c domains, indicating a uniform tetragonal structure.
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Vrejoiu et al. (2007) studied this question.
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