Self-assembled In0.5Ga0.5As quantum dots on GaP

We demonstrate the growth and luminescence of coherently strained In0.5Ga0.5As self-assembled quantum dots on GaP. Cross-sectional and planar-view transmission electron microscopy confirmed the dislocation-free nature of the In0.5Ga0.5As quantum dots and GaP cap layers. Intense photoluminescence from the quantum dots was measured at 80 K and was visible to the unaided eye in ambient lighting. The photoluminescence results show that emission energy can be controlled by varying the In0.5Ga0.5As deposition thickness. In combination with recent advances in the growth of GaP on Si, the In0.5Ga0.5As quantum dots demonstrated here could enable monolithic optoelectronic integration on Si.