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June 15, 1989Physical review. B, Condensed matter

Interface-structure analysis of amorphous semiconductor heterojunctions byin situx-ray photoelectron spectroscopy

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MKM. KawasakiUniversity of GenevaYMYoshio MatsuzakiKyushu UniversityHKHideomi KoinumaCabinet Office

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Kawasaki et al. (1989) studied this question.

synapsesocial.com/papers/6aaa0bc271e43eb1ac55873dhttps://doi.org/10.1103/physrevb.39.13316
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