As a promising lead-free ferroelectric material, Na0.5Bi0.5TiO3 (NBT) was synthesized as thin films via a classic 2-methoxyethanol sol-gel route and chemical solution deposition method. Perovskite structure with random orientation of crystallites has been obtained on platinized silicon wafer at low temperature (460°C). Piezoelectric activity in such films was detected using electrical analysis. X-ray diffraction and piezoresponse force microscopy (PFM) have been used to analyze NBT thin films with different microstructures and properties dependent on fabrication and annealing processes.
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Rémondière et al. (2007) studied this question.
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