The nucleation and growth stage of oxide formation on Rh field emitters has been investigated by imaging atom-probe mass spectroscopy. Quantitative atom-probe analysis of samples heated in 1-Torr O₂ indicated that stoichiometric Rh₂{O}₃$ is formed at temperatures as low as 500 K and suboxides are formed at lower temperatures. The activation energy for the process was determined from the temperature dependence of the surface oxygen accumulation rate to be 4-5 kcal/mole.
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G. L. Kellogg (1985) studied this question.
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