Spontaneous polarization in ferroelectric thin films can be measured accurately and at very fine resolution using the new technique presented here—low-energy electron beam–induced current scanning electron microscopy. The Figure is an electron beam–induced current (EBIC) image of a 350 nm LiTaO3 film, revealing non-homogeneous spontaneous polarization across the sample.
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Lubomirsky et al. (2000) studied this question.