Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets

Solid targets of SiO₂ CsI, and organic layers of phenylalanine have been bombarded by multicharged Arq+ ions with 1{≤}q{≤}11. The secondary ion yield has been measured as a function of the incident charge state. No charge-state dependence was observed for most of the atomic and molecular ions, which were identified by time-of-flight mass spectrometry. In contrast, the H⁺-ion emission is strongly dependent on the incident charge state.