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Epitaxial Sr0.5Ba0.5Nb2O6/MgO thin films with layers of differing thickness (but with identical total thickness) have been prepared by radio-frequency magnetron sputtering with application of discontinuous deposition technology. It is established that a decrease in the layer thickness intensifies the unit-cell deformation, which is retained if the thickness of subsequent layers does not exceed the critical value.
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Stryukov et al. (2019) studied this question.
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