The true low field Hall coefficient of copper and copper containing defects at low temperatures

The true low field Hall coefficients of various high purity copper samples and samples containing low density defects have been examined in a field of 0.0085 T over the temperature range 4.2-77K. The results on pure copper are compared with measurements made in a field of 0.5145 T. The Hall effect in copper and its dilute alloys can be analysed satisfactorily in terms of a two-group model and the band parameters obtained are able to account for the extremely large deviations from Matthiessen's rule observed in copper containing dislocations. The temperature dependence of the electron-phonon scattering anisotropy is deduced from the Hall results and found to be in good agreement with an earlier theoretical calculation.