The interfaces between hydrogenated amorphous silicon-carbon alloy and amorphous silicon, both hydrogenated and not, were investigated by photoemission spectroscopy. It is found that the valence-band discontinuity is 0.15±0.1 eV for the amorphous Si case and zero within the experimental uncertainty for the hydrogenated amorphous Si. The relevance of this result for understanding the behavior of the p-i-n amorphous solar cells is discussed.
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Evangelisti et al. (1984) studied this question.
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