In this study, we exploit the nitrogen-sulfur elemental contrast of thin-film composite (TFC) polyamide membranes and present, for the first time, the application of two elemental analysis techniques, scanning transmission electron microscopy-energy-dispersive X-ray spectroscopy (STEM-EDX) and X-ray photoelectron spectroscopy (XPS) C60+ ion-beam sputtering, to elucidate the nanoscale structure and chemical composition of the polyamide-polysulfone interface. Although STEM-EDX elemental mapping depicts the presence of a dense polyamide layer at the interface, it is incapable of resolving the elemental contrast at nanoscale resolution at the interfacial zone. Depth-resolved XPS C60+ ion-beam sputtering enabled nanoscale characterization of the polyamide-polysulfone interface and revealed the presence of a heterogeneous layer that contains both polyamide and polysulfone signatures. Our results have important implications for future studies to elucidate the structure-property-performance relationship of TFC membranes.
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Lu et al. (2015) studied this question.
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