Noise analysis of sampled-data circuits in the general framework of periodic noise modulation is discussed. The analysis relies on the Laplace transform instead of the more popular Fourier analysis. The approach leads to integral expressions that can be directly computed through numerical methods. Familiar Fourier domain expressions involving infinite series are shown to be special solutions to these integrals. The theory of the modified z transform is extended to the case of two-sided random signals to study the effect of correlated double sampling. The purpose of this analysis is to elaborate a basis for noise analysis of complex switched-capacitor (SC) circuits.
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O. Oliaei (2003) studied this question.
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