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We have developed a method of measuring magnetization process in a ferromagnetic ring by analyzing a characteristic response of a semiconductor two-dimensional electron gas (2DEG) lying beneath the ring. A 2DEG microcross structure is formed underneath a ferromagnetic ring to detect the position of paired domain walls of the onion state. The variation of the bend resistance due to the rotation of the paired domain walls is quantitatively reproduced by a semiclassical billiard model.
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Hara et al. (2006) studied this question.