Lack of influence of anisotropic electron clouds on resonant x-ray scattering from manganite thin films

The influence of eg electrons on resonant x-ray scattering was studied using RE_1-xSrₓMnO₃ (RE: rare earth) thin films having an electron configuration of (t2g)³(eg)^1-x. Based on the rigorous measurements of the Jahn-Teller (JT) distortion incorporating the buckling of the MnO₆ octahedra, we found that the JT distortion has the dominant effect in accordance with the previous reports. The data regarding the $x=1$ sample, in which eg electrons are absent, scales perfectly well with those regarding $x=0.4$ samples, confirming that the role played by eg electrons is negligible.