Two efficient synthetic routes to the first tetrathiafulvaleno-annelated porphyrins are reported. These novel porphyrin systems (see picture; Pe=pentyl) have been characterized by using a variety of techniques including EPR spectroscopy, cyclic voltammetry, and mass spectrometry. Langmuir-Blodgett films obtained from the porphyrins were used to carry out structural studies by using X-ray diffraction and atomic force microscopy.
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Becher et al. (2001) studied this question.
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