We report a series of ReVO 4 (Re = La, Ce) microwave dielectric ceramics fabricated by a standard solid‐state reaction method. X‐ray diffraction and scanning electron microscopy measurements were performed to explore the phase purity, sintering behavior, and microstructure. The analysis revealed that pure and dense monoclinic LaVO 4 ceramics with a monazite structure and tetragonal CeVO 4 ceramics with a zircon structure could be obtained in their respective sintering temperature range. Furthermore, LaVO 4 and CeVO 4 ceramics sintered at 850°C and 950°C for 4 h possessed out‐bound microwave dielectric properties: ε r = 14.2, Q × f = 48197 GHz, τ f = −37.9 ppm/°C, and ε r = 12.3, Q × f = 41 460 GHz, τ f = −34.4 ppm/°C, respectively. The overall results suggest that the ReVO 4 ceramics could be promising materials for low‐temperature‐cofired ceramic technology.
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Wang et al. (2014) studied this question.
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