Electronic transport properties of Cs-encapsulated double-walled carbon nanotubes

Electronic transport properties of Cs-encapsulated double-walled carbon nanotubes (DWNTs) synthesized via a plasma irradiation method are investigated by fabricating them as field-effect transistor devices. The authors’ results indicate that Cs-encapsulated DWNTs exhibit a high performance n-type characteristic in contrast to ambipolar behavior of pristine DWNTs. Coulomb blockade oscillations are observed on the Cs-encapsulated DWNTs at low temperatures. In addition, it is found that the semiconducting characteristics of the as-synthesized Cs-encapsulated DWNTs can possibly be controllable by adjusting applied negative dc bias voltages during the plasma synthesis process.