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Optical imaging study reveals nanoscale axial localization using single-helix point spread functions and deep learning in STED microscopy, suggesting faster volumetric super-resolution imaging.
The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.
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Ji et al. (2024) studied this question.
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