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Fourier transformation of experimental energy-dependent photoelectron diffraction data has been used to produce an essentially artifact-free image of a surface alloy. This direct method, based upon the intersection off contour arcs associated with each measurement direction, can provide vectorial atomic positions with atomic resolution. A rapid data collection mode was introduced. Surface structural sensitivity was confirmed by comparison with multiple-scattering simulations. The previously ambiguous surface geometry of c(2×{}2) Au/Cu(001) has been determined, with clear, non-model-dependent discrimination of the surface alloy over the overlayer structure.
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Tobin et al. (1993) studied this question.
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