Although neutron activation analysis for trace Ga and Ge is more sensitive and possibly more accurate, X‐ray fluorescence analysis is quicker, uses readily available equipment, and is non‐destructive. It is shown that Ga, Ge, and Ni can be determined by X‐ray fluorescence on metallographic polished mounts sufficiently accurately for classification according to Wasson's chemical groups. Results are given for 45 irons, including some not previously classified
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S. J. B. Reed (1972) studied this question.
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