High‐resolution electron microscopy and scanning electron microscopy were used to determine the distribution of intergranular films, triple‐point regions, and microvoids in synroc C. Diffraction contrast derived from interphase films, which were 1 to 3 nm thick, and from triple points showed them to be ill‐defined crystallographically, and they may be described as glassy. Pores were usually several micrometers in extent and occurred principally in rutile‐rich areas. The chemical composition of these structural features was obtained using analytical transmission electron microscopy, secondaryion mass spectrometry, X‐ray photoelectron spectroscopy, and scanning Auger microscopy. Within intergranular films, elemental enhancement of cesium, sodium, potassium, and aluminum, and possibly silicon and molybdenum, was observed. Enhancement of cesium, sodium, phosphorus, aluminum, and silicon was found in triple‐point regions. Fracture faces preferentially expose boundaries between grains, and ion exchange of
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Cooper et al. (1986) studied this question.
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