Inductively coupled plasma‐mass spectrometry has revolutionized the field of multi‐elemental analysis because of its high sensitivity and speed of analysis. However, problems with polyatomic ion interferences during routine analysis can give rise to inaccuracies. We propose a method that systematically corrects for oxide and hydroxide interferences in routine analysis, for a wide range of materials. Oxide and hydroxide production for a specified element is calculated from measurements on each sample, as levels may depend on sample composition and may also vary with time. We show that oxide and hydroxide interferences can then be calculated for other elements, by reference to a set of oxide and hydroxide ratios measured on standard solutions. Validity of correction is controlled by internal tests involving two isotopes of one element with respect to experimental errors. The limits and validity of this approach are demonstrated with the analysis of selected reference materials.
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Aries et al. (2000) studied this question.
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