The surface morphology, microstructure and transport properties of epitaxial YBa/sub 2/Cu/sub 3/O/sub 7/ and PrBa/sub 2/Cu/sub 3/O/sub 7/ thin films and heterostructures deposited on slightly vicinal substrates of SrTiO/sub 3/ by high pressure oxygen sputtering were studied. The vicinal angles of the substrates and bicrystals were less then 13/spl deg/. Depending on the tilt angle of the substrate a transition from spiral or island to step-flow growth leading to an improvement of the surface roughness was observed. Atomic force and transmission electron microscopy were used for these investigations. Furthermore, electrical and structural properties of YBa/sub 2/Cu/sub 3/O/sub 7/ thin films on vicinal offcut SrTiO/sub 3/ bicrystals with different grain boundary types were studied. This included junctions with a 2/spl times/12/spl deg/ tilt or twist of the YBa/sub 2/Cu/sub 3/O/sub 7/ c-axis across the grain boundary. In comparison to conventional [001]-tilt grain boundaries bicrystal Josephson junctions [100]-tilt grain boundaries showed high I/sub c/R/sub n/-products of up to 1.2 meV at 77 K and up to 8 meV at 4.2 K. IV-curve instabilities, probably of magnetic origin due to flux flow in the electrodes, often could be observed for junctions biased with high current densities.
No takes yet. Share an insight, caveat, or question.
Poppe et al. (2001) studied this question.
Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context: