Atomic Force Microscopy and Kelvin Probe Force Microscopy Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis, Maeda, Chikashi, Ozeki, Norihito, Kishimoto, Shigeru, Mizutani, Takashi, Sugai, Toshiki, Shinohara, Hisanori
No takes yet. Share an insight, caveat, or question.
Maeda et al. (2002) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: