We apply the Krivoglaz theory of x-ray scattering to thin epitaxial films containing misfit dislocations and reanalyze the seemingly puzzling x-ray scattering phenomena observed in several heteroepitaxial films. We show that the two-line shape scattering distribution and its dependence upon film thickness and momentum transfer can be understood in natural way and on a quantitative level. Extended diffuse x-ray scattering maps have been obtained from Nb(110)/Al2O3(112̄0) which are discussed within the framework of this theory disclose a particular dislocation network at the Nb–Al2O3 interface.
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Barabash et al. (2001) studied this question.
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