By reversibly reconfiguring a single defect in a mesoscopic copper nanobridge 10 nm wide, we have measured both the local interference and universal-conductance-fluctuation contributions to the impact of a single defect on the conductance. Both effects are in good agreement with the predictions of theory, despite the fact that the defects that reconfigure are more complicated than simple point defects.
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Ralls et al. (1993) studied this question.
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