Industrial applications of analytical electron microscopy

SUMMARY Some metallurgical studies carried out using a combined electron microscope — microanalyser (EMMA‐3) are described. A correction procedure is outlined for the quantitative X‐ray microanalysis of thin foils and small extracted particles. The applications discussed include (a) the examination of small crystals of carbides and spinel‐type oxides, (b) the analysis of small, single‐phase grains in splat‐quenched Al‐8%Fe, and (c) the identification of small ferrite grains within an austenite matrix by means of the convergent‐beam diffraction technique.