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April 1, 1998Journal of Applied Crystallography

Surface-Induced Parasitic Scattering in Bonse–Hart Double-Crystal Diffractometers

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Authors

MAM. AgamalianOak Ridge National LaboratoryDCD. K. ChristenOak Ridge National LaboratoryADA. R. DrewsNorthwestern University

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Cite This Study

Agamalian et al. (1998) studied this question.

synapsesocial.com/papers/6aaf5cd6a5af4fa898d06b4ahttps://doi.org/10.1107/s0021889897014581
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