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In this work, the effect of exchange bias on the hysteresis loop of CoFe is observed. The evolution of the coercivities and the shift of the hysteresis loop during the annealing process has been measured for films deposited on NiCr and Cu seed layers. Through comparison of the as deposited and field annealed loops, it is clear that for an exchange biased material, the two coercivities are due to different reversal processes. This behaviour is attributed to spin clusters at the ferromagnet/antiferromagnet interface, which behave in a similar manner to a fine particle system.
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Carpenter et al. (2014) studied this question.
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