Zn 1- x Cd x O crystal thin films with different compositions were prepared on silicon and sapphire substrates by the dc reactive magnetron sputtering technique. X-ray diffraction measurements show that the Zn 1- x Cd x O films are of completely (002)-preferred orientation for x ⩽0.6. For x = 0.8, the film is a mixture of ZnO hexagonal wurtzite crystals and CdO cubic crystals. For pure CdO, it is highly (200) preferential-oriented. Photoluminescence spectrum measurement shows that the Zn 1- x Cd x O ( x = 0.2) thin film has a redshift of 0.14 eV from that of ZnO reported previously.
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De-wei et al. (2003) studied this question.
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