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A study of the temperature dispersion during current-annealing of amorphous ribbons has been done. The local temperature has been obtained by measuring the local intensity of the infrared emission of the sample with a CCS nitrogen liquid cooled camera. The results exhibit a dispersion in the local temperature in spite of the small dimension of the sample. This study shows that the crystallization processes can be detected in situ through the mean square deviation of the infrared emission.>
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Morón et al. (1994) studied this question.
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