Co‐Firing and Shrinkage Matching in Low‐ and Middle‐ Permittivity Dielectric Compositions for a Low‐Temperature Co‐Fired Ceramics System

Co‐firing and shrinkage matching of low‐ and middle‐ permittivity dielectric compositions for the application to a low‐temperature co‐fired ceramics system was investigated. Several glass compositions were initially examined for the low‐temperature firing of middle‐ K ( K ∼20) dielectrics, and their compositions were further modified for shrinkage matching between low‐ K ( K ∼6) and middle‐ K layers. By controlling the processing parameters such as the solid loading ratio and stacking sequence, the warpages between hetero‐layers could be minimized.