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We report the direct observation of a photoinduced oxidation process at the buried buffer/absorber interface in high-efficiency Zn(O,OH)∕Cu(In,Ga)(S,Se)2 thin-film solar cell structures by means of x-ray emission and photoelectron spectroscopy. We propose a reaction mechanism that involves the decomposition of a hydroxide compound in the buffer layer into water and an oxide and present evidence that this process also occurs with visible light excitation and after accelerated lifetime tests of nonencapsulated devices. This suggests a possible photoinduced aging effect in solar cell devices with other hydroxide containing buffer layers or under humid conditions.
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Reichardt et al. (2005) studied this question.
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