An identity is proved that allows impurity scattering to be calculated in terms of partial waves by using conventional band-structure programs. It is particularly simple when used in conjunction with a phase-shift parametrization of the Fermi surface and it then conveniently gives the average scattering as sampled by the de Haas-van Alphen effect. The technique is illustrated by applying it to impurity scattering in copper.
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P. T. Coleridge (1973) studied this question.
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