Twinning in a CuInS2 layer in a completed thin‐film solar cell was analyzed by means of electron backscatter diffraction. This technique revealed the microstructure of the CuInS2 thin films and local orientation relationships between the grains. At various locations within the layer it was possible to retrace how twinning occurred comparing the local orientations with the theoretically possible changes in orientation by twinning. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) magnified image EBSD map of a CuInS2 cross‐section with Σ3 boundaries highlighted by red lines. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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Abou‐Ras et al. (2007) studied this question.
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