Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing

Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing , Jack W. Ekin , Oxford U. Press, New York, 2006. $125.00 (673 pp.). ISBN 978-0-19-857054-7 Buy at Amazon