Display reflectance: Basics, measurement, and rating

In this paper, methods and instruments for measurement and evaluation of reflection characteristics are reviewed as needed for research and development of electronic displays and for material and surface modeling with ray‐tracing and rendering software packages. Contrast under ambient illumination and recognizability under daylight illumination are prime development targets in the electronic‐display field, while computation and synthesis of realistic scenes and objects are pushing the need for physical data in computer graphics applications. Three categories of instruments are available for detailed reflection analysis. They are based on (1) gonioscopic (mechanical) and conoscopic (optical) directional scanning, (2) imaging approaches, and (3) on arrangements with variable source or receiver aperture. The capabilities, advantages, and limitations of these methods are introduced and discussed in order to facilitate appropriate selection of methods and instruments. For illustration purposes we present typical results obtained from commercial electronic display screens. A basis for continued widespread implementation and standardization of reflection metrology as required for objective rating and comparison of electronic‐display screen performance under ambient illumination is provided.