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October 31, 2002Journal of Applied Physics

Thermal stability of the exchanged biased CoFe/IrMn electrode for the magnetic tunnel junction as a function of CoFe thickness

Ju Hee Lee Sang-Jin Kim Chong Seung Yoon C. K. Kim B. G. Park T. D. Lee

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Abstract

Pinned electrodes of the magnetic tunnel junction (MTJ) consisting of Ta/AlOx/CoFe(x)/IrMn/NiFe/Ta, where 35 Å

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Lee et al. (2002) studied this question.

synapsesocial.com/papers/6ab1d70622725abcd3a9ab8b https://doi.org/10.1063/1.1516623

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