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August 10, 2010IEEE Transactions on Microwave Theory and Techniques

Characterization of GaN HEMT Low-Frequency Dispersion Through a Multiharmonic Measurement System

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Authors

ARAntonio RaffoUniversity of FerraraSFSergio Di FalcoVVValeria VadalàUniversity of Milano-Bicocca

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Raffo et al. (2010) studied this question.

synapsesocial.com/papers/6ab1dc229ecc1e1d44b375cehttps://doi.org/10.1109/tmtt.2010.2058934
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