Answers are grounded in this paper and cite their sources.
In this letter we report the application of barium–strontium–titanate (BST) thin film oxides as the dielectric layer in radio-frequency-microelectromechanical system (rf-MEMS) capacitive switches. BST thin films deposited at ambient temperature by off-axis sputtering have been employed for application in rf-MEMS switches. Their dielectric properties have been characterized in the frequency range from 1 to 20 GHz both on magnesium oxide and on gold metal films. Switches have been fabricated which demonstrate promising on-state capacitance and good dielectric breakdown properties. Dielectric breakdown in excess of 400 kV/cm has been measured on switches cycled in excess of 2000 times during testing.
No takes yet. Share an insight, caveat, or question.
Kirchoefer et al. (2002) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: